ADS5400-SP_Radiation_Report
Note: The following radiation test results are provided for information only, as these devices are not Radiation Hardness
Assured (RHA) at this time.
Samples of the 5962-0924001VXC, ADS5400-SP, device have been evaluated to determine performance effects
after Total Ionizing Dose (TID) radiation exposure. Twenty samples were exposed under biased conditions at 50
rad(Si)/sec. Bias conditions were the same as the circuit used for burn-in.
Radiation exposure for all samples was performed at Radiation Assured Device, Inc. in Colorado Springs, CO. Pre
and post radiation electrical testing was performed by Texas Instruments in Dallas, TX.
The TID samples were pulled from the initial qualification lot after completing normal class-V processing
(assembly, burn-in, full-temp testing), and serialized datalogs were collected at 25C before and after radiation
exposure. The electrical testing results are included in the release documentation. The test results are summarized
below.
Click following link:
DatasheetDoc-Texas Instruments TI pdf datasheet download
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