ADS5424-TID-Data.pdf
On February 10-11, 2006, ICS irradiated 25 TI-ADS5424 14-Bit ADC ICs (Log 1453)
manufactured by Texas Instruments, Sherman, Texas. The Texas Instruments purchase
order number is 4511270487. The ICS Task number is 742. The radiation test procedure is
RTP 640.
The TI-ADS5424 14-Bit ADCs were irradiated per RTP 640, The total dose exposures were
25, 50, 75, 100 & 150krads(Si), one level for each group of five devices (serialized) at a
dose rate of 2.71rad(Si)/second [9756 rads(Si)/hour]. The TI-ADS5424 14-Bit ADCs were
placed in a customer supplied burn-in/radiation bias board. The bias board was set to the
distance of 60cm from the Co60 source. This provided for a dose rate of
2.71rads(Si)/second to each device.
The TI-ADS5424 14-Bit ADCs were positioned to uniformly expose the entire Bias Board
area. The total irradiation time for 150krad(Si) was 15.4 hours.
NOTE: All devices were immediately placed in a chilled Dry Ice environment when they
ended their respective exposure periods.
The irradiator was the Shepherd Gammabeam 150-C, room source at The Salk Institute,
La Jolla, California.
The dose rate calculation is based on the Salk Institute dose rate vs. distance calibration
chart. Their source is calibrated by J.L. Shepherd & Associates and is traceable to NIST.
The setup consisted of:
25 pieces plus 15 spare, TI-ADS5424 14-Bit ADCs
1 Bias board (TI supplied 50 position burn in board)
1 Fluke Model 8600A DMM Calib # BF1176.
1 Fluke Model 8600A DMM Calib # BF1174.
1 Trygon Electronics DC Power Supply Model RS 40-10 (40V-10A).
1 HP DC Power Supply Model 6216C.
1 Shepherd Gammabeam 150-C.
The bias board voltages and currents were monitored and recorded at the start and end of
exposure period. See Exposure Activity Log for details. All test equipment is property of ICS
with the exception of the Shepherd Gammabeam 150-C and the DUTs.
The exposure groups by serial # and exposure level are as follows:
25krads (Si) TID —S.N. 22, 23, 24, 25, & 26.
50krads(Si) TID —S.N. 17, 18, 19, 20, & 21.
75krads(Si) TID —S.N. 12, 13, 14, 15, & 16.
100krads(Si) TID —S.N. 6, 7, 8, 9, & 11. (S/N 10 was not irradiated).
150krads(Si) TID —S.N. 1, 2, 3, 4, & 5.
No unusual events were observed during the radiation exposure of the TI-ADS5424 14-Bit
ADCs.
The 3.3 volt supply was less then 1mA for the bias board (total for all devices on the board).
There was a Kelvin connection at the bias board to monitor and maintain the 3.3 Volts.
The 5 volt supply indicate an increase per device, as the number of devices on the board
decreased (See the Exposure Activity Log at the end of this report). ICS has no
explanation of why the current per device increased with the removal of each group of five
devices. There was a Kelvin connection at the bias board to monitor and maintain the 5.0
Volts.
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